SubTitle :
third international symposium ,ATVA 2005 Taipei,taiwan,october 4-7.2005 proceedings
Author Statement :
Doron A.peled,yih-kuen Tsay
Collation :
xii,506 P.:illus,tables,fig.
Title :
Automated technology for verification and analysis
LC CutterNumber :
P 381 A
تاريخ ورود اطلاعات :
1387/03/11
Subject :
Computer- aided design -- congresses,Engineering design --data processing -- congresses
