Author :
Beck, Friedrich
Author Statement :
Friedrich Beck
Collation :
xiv, 173 P.: Figures, Table
Addition :
,
Title :
Integrated circuit failure analysis:A guide to preparation techniques
LC Class :
621
LC Number :
. 3815
LC CutterNumber :
B 393 I
Publication Year :
1997
Publication :
John Wiley & Sons
Subject :
Semiconductors- Failures,Semiconductors- Testing.
Translator :
Translated by stephen S. Wilson
DocumentNumber :
30315
ISBNN :
, 1 , 2006 , 3-1
Link To Document :
http://lib1.kashanu.ac.ir//dL/search/default.aspx?Term=8268&Field=0&DTC=2
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