Author :
Bhattacharya, Debashis, 1961
Author Statement :
by Debashis Bhattacharya,John P. Hayes
Collation :
X, 159 P.: Figures
Title :
Hierarchical modeling for VLSI circuit testing
LC CutterNumber :
B 575 H
Publication :
Kluwer Academic
Subject :
Integrated circuits- Very large scale integration testing,Integrated circuits- Very large scale integration- Computer simulation.
