Author :
Fujiwara, Hideo
Author Statement :
Hideo Fujiwara
Collation :
x, 284 P
Addition :
,
Title :
Logic testing and design for testability
LC Class :
621
LC Number :
.395
LC CutterNumber :
F 961 L
تاريخ ورود اطلاعات :
1383/09/01
Publication Year :
1985
Publication :
MIT Press
Series :
MIT Press series in computer systems
Subject :
Logic circuits- Testing
DocumentNumber :
32149
ISBNN :
, 1 , 3530 , 3-1
Link To Document :
http://lib1.kashanu.ac.ir//dL/search/default.aspx?Term=9781&Field=0&DTC=2
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