• Author Statement
    Friedrich Beck
  • Collation
    xiv, 173 P.: Figures, Table
  • Addition
    ,
  • Title

    Integrated circuit failure analysis:A guide to preparation techniques

  • LC Class
    621
  • LC Number
    . 3815
  • LC CutterNumber
    B 393 I
  • Publication Year
    1997
  • Publication
    John Wiley & Sons
  • Subject

    Semiconductors- Failures,Semiconductors- Testing.

  • Translator
    Translated by stephen S. Wilson
  • DocumentNumber
    30315
  • ISBNN
    , 1 , 2006 , 3-1
  • RecordNumber
    8268