• Author Statement
    by Debashis Bhattacharya,John P. Hayes
  • Collation
    X, 159 P.: Figures
  • Addition
    ,
  • Title

    Hierarchical modeling for VLSI circuit testing

  • LC Class
    621
  • LC Number
    . 395
  • LC CutterNumber
    B 575 H
  • Publication Year
    1990
  • Publication
    Kluwer Academic
  • Subject

    Integrated circuits- Very large scale integration testing,Integrated circuits- Very large scale integration- Computer simulation.

  • DocumentNumber
    30399
  • ISBNN
    , 1 , 1203 , 3-1
  • RecordNumber
    8344
    • Link To Document
    https://lib.kashanu.ac.ir//dl/search/default.aspx?Term=8344&Field=0&DTC=2